The automotive industry continues to evolve toward increasingly complex systems, demanding faster, more stable, and more integrated communication. Modern vehicles rely on data networks for ADAS, cameras, sensors, infotainment, powertrain, and safety systems. The growing data volume and real‑time requirements make traditional protocols such as CAN and LIN insufficient for certain applications, creating the need for technologies like Automotive Ethernet and CAN FD SIC.
To address these challenges, we present a combined solution from NI (National Instruments) and Pickering Interfaces, offering a complete testing ecosystem covering automotive networking, ECU validation, sensor simulation, and fault insertion. These two vendors complement each other: NI provides reliable vehicle communication interfaces, while Pickering delivers fault simulation and switching capabilities that allow engineers to test ECU behavior under real‑world conditions.
According to NI’s official documentation:
“NI meets these evolving demands with a robust portfolio of legacy interfaces like LIN/CAN and modern protocols such as Automotive Ethernet and CAN FD SIC.” “This ensures reliable, high‑speed data exchange for advanced vehicle systems.”
Download NI Official Brochure (PDF)
NI’s solutions include full support for CAN, CAN FD SIC, LIN, FlexRay, and Automotive Ethernet, with interfaces such as 100/1000BASE‑T, 100/1000BASE‑T1, 1000BASE‑T1, and 10GBASE‑T1. These products feature 802.1AS hardware time‑stamping, master/slave mode capability, and protocol support for AVTP, AVB, XCP, DoIP, UDS, and TC10. Integration through NI‑XNET API, LabVIEW, CVI, Windows, and NI Linux Real‑Time ensures efficient workflows and seamless integration into test benches or HIL systems. With environmental specifications such as operation from 0–55°C, shock resistance up to 30 g, and vibration tolerance from 5–500 Hz, NI products are designed for durability and reliability in demanding test conditions.
To complement complex testing needs, Pickering Interfaces offers switching and simulation solutions that enable engineers to create realistic test scenarios. Pickering provides fault insertion modules for CAN, LIN, and Ethernet, programmable resistor modules for sensor simulation (e.g., thermistor and strain gauge), and high‑density PXI/LXI switching for large‑scale automated testing. These solutions are ideal for HIL testing, robustness validation, EV/BMS testing, and scenarios requiring precise signal manipulation or fault injection. Integration with LabVIEW, TestStand, MATLAB/Simulink, and PXI/LXI platforms ensures full compatibility with modern test systems.
By combining NI and Pickering, engineers gain a more complete testing platform. NI handles vehicle communication and protocols, while Pickering enables fault simulation, sensor manipulation, and automated switching to replicate real‑world conditions. This synergy allows comprehensive ECU testing—from normal communication to fault conditions and complex sensor simulations—enhancing test coverage, accelerating validation, and reducing system failure risks in production vehicles.
This solution is ideal for ECU development and validation, ADAS and infotainment networking, powertrain communication, EV/BMS testing, HIL robustness, sensor behavior testing, and vehicle diagnostics. With NI’s strong communication foundation and Pickering’s flexible simulation capabilities, you can build a scalable, future‑proof test system ready to support next‑generation automotive requirements.
If you need system integration, testing workflow design, or configuration recommendations tailored to your application, our team is ready to help you build the most optimal solution.
Start a real conversation, reach out directly to discuss your use case and constraints:
Sales (WhatsApp): +62 821-2357-6487
Email: sales@haliatech.com
Office: (021) 22178880
