Semiconductor Testing

  • 05
    Aug

    CV/IV Measurement System with PXIe-4190 LCR Meter and SMU

    CV/IV Measurement System with PXIe-4190 LCR Meter and SMU

    Banyak elemen dan perangkat semikonduktor memerlukan pengukuran tegangan arus (IV) dan tegangan kapasitansi (CV) untuk mengetahui informasi penting tentang manufacturing process atau memvalidasi kinerja dari sebuah perangkat. Secara tradisional, pengukuran IV dilakukan dengan source measure unit (SMU) dan pengukuran CV dilakukan dengan LCR meter, capacitance measurement unit (CMU), atau impedance…

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